Selected-Area Small-Angle Electron Diffraction

Selected-area electron diffraction capable of resolving spacings up to 2000 ]k from first-order discrete reflections has been achieved using a standard, double-condenser electron microscope. The technique allows photographing of the selected area, at sufficient magnification, that gives rise to the small-angle scattering pattern, in addition to the normal capabilities of obtaining related wide-angle diffraction and wide-angle and small-angle dark-field micrographs. Most, but not all, of the results of discrete and diffuse, small-angle electron diffraction studies from a large variety of specimens including drawn, annealed polyethylene, latex particles, evaporated gold particles, grating replicas, and slit edges have been explained on the basis of the structures observed in the corresponding electron micrographs. Small-angle electron diffraction is found to be more sensitive to defects in the packing of the scattering centres than small-angle X-ray scattering.